منابع مشابه
Subwavelength diffraction management.
We study light propagation in nanoscale periodic structures composed of dielectric and metal in the visible range. We demonstrate that diffraction can be tailored both in magnitude and in sign by varying the geometric features of the waveguides. Diffraction management on a subwavelength scale is demonstrated by numerical solution of Maxwell equations in the frequency domain.
متن کاملLight diffraction by a subwavelength circular aperture
Diffraction of normally incident light by a subwavelength circular aperture is calculated analytically. The aperture is opened on a perfectly conducting planar screen with infinitesimal thickness. In our model, the aperture is replaced by uniform magnetic currents and charges. The model allows one to obtain the normalized cross section for the aperture radius up to half of the wavelength, which...
متن کاملDiffraction from a subwavelength elliptic aperture: analytic approximate aperture fields.
An analytical approximate solution of the electromagnetic field on a subwavelength elliptical hole in a thin perfectly conducting screen is presented. Illumination is a linear polarized, normally incident plane wave. A polynomial development method is used and allows one to obtain an easy-to-use analytical solution of the fields, which can be used to build analytical expressions of aperture fie...
متن کاملBeam focusing in reflections from flat subwavelength diffraction gratings
Y. C. Cheng,1 J. Redondo,2 and K. Staliunas1,3 1Departament de Fisica i Enginyeria Nuclear, Universitat Politècnica de Catalunya, Colom 11, 08222 Terrassa, Barcelona, Spain 2Instituto de Investigación para la Gestión Integrada de Zonas Costeras, Universitat Politècnica de València, Paranimf 1, 46730 Gandia, València, Spain 3Institució Catalana de Recerca i Estudis Avançats (ICREA), Pg. Lluı́s Co...
متن کاملMeasuring and modeling optical diffraction from subwavelength features
We describe a technique for studying scattering from subwavelength features. A simple scatterometer was developed to measure the scattering from the single-submicrometer, subwavelength features generated with a focused ion beam system. A model that can describe diffraction from subwavelength features with arbitrary profiles is also presented and shown to agree quite well with the experimental m...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2008
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.33.002662